Session code: 2BV.2.16   

Potential Induced Degradation (PID) - Applied Field Analysis, Regeneration and Prevention in the Field, Standard Test

W. Vaassen, G. Mathiak, R. Düpont, H. Becker, W. Herrmann, L. van Rensburg

Abstract


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Keywords


degradation; electroluminescence; large grid-connected PV systems; performance; qualification and testing

Full Text:

POSTER PDF


DOI: http://dx.doi.org/10.5071/1stAfricaPVSEC2014-2BV.2.16

ISBN 978-88-89407-103

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